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EEC/SMART-2005 intelligent ET /MMT/UT tester is a new generation of NDT instrument with powerful functions, leading technique and good expansibility. With advanced technologies and functions, such as array eddy current testing ability, multi-channel testing functions of magnetic memory and magnetic flux leakage, 80M high-speed sampling UT function use 12bit A/D, DSP digital processing technique, SMT process technology, EEC/SMART-2005 is multi-functional tester which can be |
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| applied in various industries. The equipment is supply power by new-type lithium battery, and the users can select display of TFT true-color or electroluminescent high-light. EEC/SMART has industrial computer modular organization with stable performance and high reliability. The equipment can supply strong computational capability, display of large screen and high resolution, and storage space of large testing data. |
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| Main parameters and technical feature |
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M agnetic memory detecting |
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Measurable channel: 8 channels |
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Minimum measurable distance: 1mm |
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Maximum measurable distance: 150mm
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Maximum scanning speed: 0.5m / Second |
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Eddy current/remote-field detection |
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2 frequency and 4 channel (Extendable to 8 frequencies) |
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frequency range: 64Hz-5MHz (Remote field:5Hz~5KHz) |
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Gain: 0-90dB，step length: 0.5dB |
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Automatically/manually measure amplitude and phase |
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Non-equal phase/amplitude alarming |
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Array eddy current testing function and C-scan function |
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Impedance plane and stripe curve displays |
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Parameter, graphic data can be transferred between the same type equipment or with microcomputer |
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Online operation, prompt with hotkey help |
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Magnetic Flux Leakage /low frequency electromagnetic detecting |
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Channels:8 |
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Gain: 0-90dB，with step length of 0.5 dB |
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High-pass wave: 0~500Hz |
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Low-pass wave:10Hz～10KHz |
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Ultrasonic detecting |
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Range of working frequency: 0.5M～20M |
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Adjust gain: 0-120dB with step length of 0.5dB（Hairbreadth: -1dB～3dB） |
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Demodulation way: positive/ negative, bi-direction and RF |
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Sampling precision: 12 bit AD |
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Sampling velocity: 80MHZ
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Pulse shift: -10～1000m/s (steel longitudinal wave) |
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Zero point of probe: 0～200μS |
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Sound velocity of Material: 1000～15000m/s |
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Testing range: 0～10000mm (steel longitudinal wave) |
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Continue-adjustable, minimum display range : 1.0mm |
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Suppress: -80% linear restrain |
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Error of vertical linearity: ≤3％ |
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Surplus sensitivity: ≥ 53dB |
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DAC/TDG curve |
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Measuring resolution: 0.03mm |
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Memory date: 1000 groups, 100 groups of parameters |
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Others technical standard |
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Microprocessor: 16 bits |
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Memorizer: 128M (Extendible to 2G) |
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Internal memory capacity: 16M |
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TFT color screen/ High-light EL screen: EL 320x240 |
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Operating temperature: -25℃～＋60℃ |
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Internal power supply: 14.4V 4AH (rechargeable lithium battery) |
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External power supply: AC 220V |
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Graphics and parameter can be stored, replayed
and analyzed |
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